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Micto to Nano™ EM-Tec SEM sample holders
The Micro to Nano EM-Tec range of SEM sample holders comprises a wide variety of holders to make it easier and quicker to mount your samples directly in the SEM.

Samples are held by clamping between jaws or secured with screws. When samples are secured correctly, the sample won’t move which increases spatial resolution both for imaging and analysis. With the EM-Tec SEM sample holders there are no out-gassing or contamination issues. All EM-Tec SEM sample holders with a M4 threaded hole are fully compatible with the EM-Tec SEM stage adapters.

The comprehensive selection:

Angled and Tilt holders

The EM-Tec variable tilt and pre-tilt holders are useful for imaging samples under a pre-tilt angle without having to tilt the SEM stage. With these holders you can image previously mounted samples on standard pin stubs or Hitachi stubs at pre-set angles or any chosen angle.

Capacity, size and compatibility of the EM-Tec pre-tilt and variable tilt holders:

 

Bulk SEM sample holders

The EM-Tec bulk sample holders are designed to hold awkwardly shaped and bulk samples. These sample holders are either rectangular or round and have brackets with screws to securely hold the sample in place.

  • EM-Tec GB16 – Rectangular type bulk sample holder with two side brackets for sample thickness up to 16mm.  Made from brass, 1µm thick gold plated. Ideal for smaller samples and smaller SEMs.
  • EM-Tec B26 – Rectangular type bulk sample holder with two side bracket for sample thickness up to 26mm. Made from vacuum grade aluminium.
  • EM-Tec B38 – Rectangular type bulk sample holder with two side bracket for sample thickness up to 32mm. Made from vacuum grade aluminium.
  • EM-Tec B52 – Rectangular type medium bulk sample holder with two side bracket for sample thickness up to 52mm. Made from vacuum grade aluminium.
  • EM-Tec V80 – Rectangular type large bulk sample holders with two repositionable side brackets for sample width up to 80mm. Made from vacuum grade aluminium.
  • EM-Tec V120 –Rectangular type extra-large bulk sample holders with two repositionable side brackets for sample width up to 120mm. Made from vacuum grade aluminium.
  • EM-Tec GR20 – Round type bulk sample holder with three brackets for round and awkwardly shaped samples up to Ø20mm. Made from brass, 1µm thick gold plated. Ideal for smaller samples and smaller SEMs.
  • EM-Tec R32 –  Round type bulk sample holder with three brackets for round and awkwardly shaped samples up to Ø32mm. Equally useful as metallographic mounts holder for 30mm / 1-1/4” mounts. Made from vacuum grade aluminium.
  • EM-Tec R51 –  Round type bulk sample holder with three brackets for round and awkwardly shaped samples up to Ø51mm. Equally useful as metallographic mounts holder for 50mm / 2” mounts. Made from vacuum grade aluminium
  • EM-Tec R98 – Universal large bulk sample holder with 4 mounting pillars on a Ø117mm pin plate. Mounting pillars can be spaced on the pin plate to accommodate large awkwardly shaped sample op to 98mm in diameter. Made from vacuum grade aluminium with stainless steel thumb screws.

 

Centering vise holder

The EM-Tec CV1 large centering vise SEM sample holder keeps the sample always clamped in the centre of the holder. Both vise clamp jaws simultaneously move away or to the centre of the holder at the same time. The EM-Tec CV1 large centering vise clamp includes two base plates on which the vise jaws can be re-positioned for optimum sample compatibility. The brass dual vise spindle is located underneath the baseplates with knurled handles at both ends. The spindle can be operated from either side.

Features of the EM-Tec CV1 large centering vise SEM sample holder are:

  • provides firm grip for large and heavy samples
  • automatically holds the sample in the centre of the SEM stage
  • easier navigation from the centre of the SEM
  • positionable vise jaws on the base plate for optimum sample compatibility
  • standard stage clamps from 0 to 110mm
  • spindle extension can be removed to reduce overall size
  • optional extension base plates allows clamping from 0 to 155mm
  • standard vise jaws with triple grooved side and smooth side
  • optional vise jaw with single 120° groove for round samples
1- Sample holder for up to 110mm closed
2- Sample holder for up to 110mm open
3- Sample holder extended size closed
4- Sample holder extended size open

 

TSB 12-000202 EM-Tec CV1 large centering vise

 

Compact and universal vises

Vise type sample holders are quick and easy to use. They hold the sample by clamping it between the moving jaws, this enables quick sample loading and reduces down time.  They especially useful when similar samples or series of the same sample need to be examined.
The compact and/or springloaded EM-Tec SEM sample holders currently available are:

  • EM-Tec V22 compact vise sample holder for sample sizes up from 0-22mm. One fixed jaw and a spindle driven moving jaw. Cost-effective compact vise which can be used in both standard SEMs and table top SEMs. Made from vacuum grade aluminium, brass spindle and stainless steel screws.
  • EM-Tec MV22 combined compact vise holder (0-22mm) plus multi pin stub holder for up to 5 standard 12.7mm pin stubs. This cost-effective multi holder has been designed for table top SEMs and SEMs with smaller specimen stages. One fixed jaw and spindle drive to move other jaw. Made from vacuum grade aluminium, brass spindle and stainless steel screws.
  • EM-Tec 3V22 triple compact vise holder includes three separately adjustable EM-Tec V22 compact vises on a single base plate. Enables holding and investigating three different samples to save on SEM venting and pumping time. Made from vacuum grade aluminium, brass spindles and stainless steel screws.
  • EM-Tec VS8 mini single action spring-loaded vise for samples with a maximum clamping size of 8mm. The vise is opened by pulling the moving vise jaw. Ideal for quickly loading thin cross-sections. The vise base dimensions are Ø25 x 12.5mm height. Made from vacuum grade aluminium with stainless steel rods and springs.
  • EM-Tec VS12 is a compact single action spring-loaded vise for samples with a maximum clamping size of 12mm. The vise is opened by pushing the moving vise jaw with a push rod. The push rod can be removed when the holder is loaded in the SEM. Dowel pins can be inserted in the fixed and moving jaws to increase the opening to a sample size up to 18mm diameter or to hold awkwardly shaped samples; 4 dowel pins are included. Made from vacuum grade aluminium with stainless steel rods and springs.
  • EM-Tec VS26 is a compact double action spring-loaded vise for samples with a maximum clamping size of 26mm. Due to the double sided spring, this vise acts as a centering vise. The vise jaws are opened by push rods which can be removed when the sample holder is loaded in the SEM. Dowel pins can be inserted in the jaws to increase the opening to a sample size up to 34mm diameter or to hold irregular shaped samples; 4 dowel pin are included. Made from vacuum grade aluminium with stainless steel rods and springs.
  • EM-Tec VS43 universal double sided spring-loaded larger vise for samples with a maximum vise opening of 42mm. Different type of jaws can be mounted on the EM-Tec universal spring-loaded vise. Opens by pulling the jaws. Dowel pin pins be inserted in the brass slider to extend the opening size and to hold awkwardly shaped samples. With the dowel pins a disc of up 50mm diameter can be held; 4 dowel pins are included. Includes triple grooved/smooth vise jaws.

The EM-Tec vise sample holders are available with pin and with an M4 threaded hole.

Specifications of the EM-Tec compact and universal vise clamp holders:

 

C-Square multi pin stub holders

The EM-Tec C-Square multi pin stub holders are primarily designed to hold multiple Ø12.7mm and/or Ø25.4mm pin stubs with the standard 3.2mm pin diameter. Larger or smaller pin stubs can also be used on the EM-Tec C-Square multi pin stub holders. They offer optimum X-Y coverage of the SEM stage and allow for easy alignment with the square sides and additionally engraved lines in X-Y directions. To facilitate quick and easy loading and exchange of the pin stubs, proprietary conductive gripping O-rings hold the pin stubs in place and provide a conductive path at the same time.

The EM-Tec C-Square multi pin stub holders are available in 7 different sizes:

  • EM-Tec CS9/4 C-Square multi pin stub holder for 9x Ø12.7mm or 4 x Ø25.4mm pin stubs
  • EM-Tec CS16/4 C-Square multi pin stub holder for 16x Ø12.7mm or 4 x Ø25.4mm pin stubs
  • EM-Tec CS18/6 C-Square multi pin stub holder for 18x Ø12.7mm or 6 x Ø25.4mm pin stubs
  • EM-Tec CS25/4 C-Square multi pin stub holder for 25x Ø12.7mm or 4 x or 9 x Ø25.4mm pin stubs
  • EM-Tec CS36/9 C-Square multi pin stub holder for 36x Ø12.7mm or 9 x Ø25.4mm pin stubs
  • EM-Tec CS49/9 C-Square multi pin stub holder for 49x Ø12.7mm or 9 x Ø25.4mm pin stubs
  • EM-Tec CS64/16 C-Square multi pin stub holder for 64 x Ø12.7mm or 16 x Ø25.4mm pin stubs

Feature and benefits of the EM-Tec C-Square multi pin stub holders:

  • Conductive pin gripping O-rings for quick and easy exchange of stubs
  • Compatible with standard pin stubs and short Zeiss pin stubs with 3.2mm pin diameter
  • Square holders optimised for X-Y travel directions
  • Reference point in the upper right corner
  • Easy programmable locations
  • Alphanumeric location ID
  • Engraved orientation lines to facilitate X-Y alignment
  • Fully compatible with all EM-Tec SEM stage adapters
  • Ideal for automated SEM/EDX particle analysis and GSR analysis
  • Suitable for correlative & corroborative microscopy applications

Specifications of the EM-Tec C-square multi pin stub holders:

 

EBSD sample holders

The EM-Tec EBSD pre-tilt sample holders all include a 70° pre-tilt angle to facilitate EBSD analysis. With a 70° pre-tilt angle there is no need to tilt the SEM sample stage.  Using 70° pre-tilted holders instead of tilting the SEM stage offer definite advantages:

  • Correct EBSD angle when loading sample
  • No stage drift in Z-direction
  • Choice of 70° or 20° pre-tilt

The EM-Tec EBSD sample holder kits  combine a number of available  EM-Tec SEM sample holders: metallographic mount holders, geological slide holder, small vise type holders and S-Clip holders. These are combine with the EBSD 70° pre-tilt holder and a height extender if needed.  The EM-Tec P70 and H70 pre-tilt EBSD holders include both 70° pre-tilt and -20° pre-tilt to enable EBSD measurements at 90° angle at the same sample. The EM-Tec EBSD 70° pre-tilt holders are available with pin and M4 threaded hole. The available EM-Tec EBSD sample holders and sample holder kits  with 70° pre-tilt angle are:

  • EM-Tec P70 / H70 EBSD holder for pin stubs and pin stub type sample holders, pin / M4
  • EM-Tec P70M / H70M EBSD holder for Hitachi M4 stubs and M4 threaded holders, with pin / M4
  • EM-Tec P71 / H71 EBSD sample holder kit for 25mm (1”) metallographic mounts, with pin / M4
  • EM-Tec P72 / H72 EBSD sample holder kit for 30mm (1-1/4”) metallographic mounts, with pin / M4
  • EM-Tec P73 / H73 EBSD sample holder kit for up to 48x28mm geological slides, with pin /M4
  • EM-Tec P74 / H74 EBSD sample holder kit for FIB lamellas, with pin / M4
  • EM-Tec P75 / H75 EBSD S-clip sample holder kit for Si chips & thin samples, with pin / M4
  • EM-Tec P76 / H76 EBSD mini vise clamp holder for cross-section samples up to 4mm, with pin / M4
  • EM-Tec P77 / H77 EBSD mini split mount vise holder for cross-section samples up to 8mm, with pin / M4
  • EM-Tec P78 / H78 EBSD vise clamp holder for samples up to 16mm, with pin / M4
  • EM-Tec TE1 t-EBSD holder for a single TEM / FIB Lift-out grid with pin / M4
  • EM-Tec TE3 t-EBSD holder for three TEM / FIB Lift-out grids with pin / M4

EBSD-3D holder FEI/Thermo

The EBSD-3D sample holder for FEI / Thermo DualBeam FESEM/FIB systems permits FIB milling of the sample and subsequent acquisition of EBSD data. Repeatedly rotating the sample 180 between the milling and the EBSD mapping positions enables collecting 3D EBSD mapping data. This holder is to be used with the FEI EBS3 software and FEI / Thermo DualBeam systems.
The EBSD-3D holder can be used to analyse either the surface or a cross-section of a sample. The angles on the EBSD-3D sample holder are 54° (short facet) and 36°  (long facet).  The sample holder is mounted in the centre of the sample stage with M6 fine thread. The sample stage should be set at 16° tilt.

  • For analysing cross sections, the sample should be mounted on the short facet, with the 16° pre-tilt this would represent 36° + 16° = 52° tilt; the cross section is now perpendicular to the FIB column. When the EBSD-3D holder is rotated by 180°, the milled sample surface is then at the 70° angle (54° + 16°) for EBSD data collection.
  • For analysing larger surfaces, the  sample should be mounted on the long facet, with the 16 pre-tilt this would represent 36° + 16° = 52° ; the sample surface is now perpendicular to the FIB column. When the EBSD-3D holder is rotated by 180°, the milled sample surface is at the 70° angle (54°  + 16°) for EBSD data collection.

Made from vacuum grade aluminium. Produced in cooperation with FEI EBS3 users.

FIB grid holders

The EM-Tec FIB grid holders are designed to hold FIB grids and provide easy access to the posts on the FIB grids to attach the milled FIB lift-out lamellae. The FIB grid holders can be used in the FIB/SEM systems but also for safe storage of the FIB grids with attached lamellae. The EM-Tec FIB grid and sample holders are compact holders which hold the FIB grids directly aside a standard  SEM pin stub with a sample. The lift-out lamellas only need to be moved over a short distance to attach them to the  FIB grids. The EM-Tec FIB grid holders are all  precision machined from vacuum grade aluminium:

  • EM-Tec F12 is a basic yet practical FIB grid holder for 2 FIB grids. Based on the standard Ø12.7mm pin stub it is compact, low cost and useful for storing valuable samples. The 10mm wide vise clamp includes a ledge for easy positioning of the FIB grids. Available with standard pin and short Zeiss pin (EM-Tec F12Z)
  • EM-Tec F18 is a high capacity FIB grid holding stub for holding up to 8 FIB grids with 4 individual small clamps. It is basically 4 x the EM-Tec F12 on a 25.4mm (1”) stub. Each of the 10mm wide vise clamps includes a ledge for easy positioning of the FIB grids. Ideal for safe storage of the FIB grids with lamellas or for high throughput FIB applications.
  • EM-Tec F25 is a larger FIB grid holder which can accommodate up to 5 FIB grids of the same thickness. The 25mm wide vise includes a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise. Available with pin stub and M4 threaded hole.
  • EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2”) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples. Available with pin stub and M4 threaded hole.
  • EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1”) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples. Available with pin stub and M4 threaded hole.
  • EM-Tec FS25 combines the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts. Available with pin stub and M4 threaded hole.

These holders can all be used on th FIB and FIB/SEM systems from FEI, Hitachi, Zeiss and Tescan.For JEOL FIB/SEM systems use a suitable EM-Tec stub adapter.

Capacity, size and compatibility of EM-Tec FIB grid holders and FIB grid sample holders:

 

Filter disc holders

The EM-Tec filter disc holders are developed to hold flat discs type filters to enable SEM / EDS analysis. The EM-Tec filter disc holders comprise of two parts; a flat base plate to hold the filter disc and a cap which acts as clamping ring to keep the filter flat on the base. The cap is secured with three screws at the side of the base plate. The base plate and clamping ring are made from vacuum aluminium; the screws are made form stainless steel. The EM-Tec filter disc holders are available for 13, 25, 35 and 47mm filter discs. Custom diameters can be made on request. The edge of the cap has a 45° angle to avoid contribution of aluminium to the EDS spectra. The EM-Tec filter disc holders enable SEM / EDS analysis of particles, fibres and debris on the filters.  They are available with:

  • standard pin to fit on SEM using the standard pin; FEI, Philips, Tescan, Phenom, Aspex, RJLee,   AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs.
  • M4 threaded hole; compatible with Hitachi SEMs, FESEMs and table top SEMs and with the EM-Tec versatile SEM stage adapters
  • Ø14mm JEOL stub compatible with JEOL and EM-Tec stage adapters with a Ø14mm connection

Capacity and dimensions for the  EM-Tec filter disc holders:

 

Geological slide holders

The EM-Tec geological thin section or petrographic slide holders are especially designed to securely hold geological thin sections on petrographic slides for imaging and analysis with an SEM, EPMA or specially configured mineral analyzers. They are used for SEM/EDS imaging and analysis in geology, mineralogy and petrography. The EM-Tec thin section holders are compatible with petrographic slides sizes of 28x48mm, 27x46mm, 26x46mm and 25x45mm. We currently offer two types of geological thin section holders:

  • Geological thin section holders and slide holders with S-Clips
    • EM-Tec G0 universal thin section slide holder for a single slide
    • EM-Tec G2.0 universal petrographic slide holder for two slides
    • EM-Tec G4.0 universal petrographic slide holder for four slides
  • Reference type geological thin section holders with a reference edge
    • EM-Tec RG2 twin petrographic slide top reference holder for two up to 48x28mm slides
    • EM-Tec RG4 four petrographic slide top reference holder for four up to 48x28mm slides

All EM-Tec petrographic slide section holders are available with a standard 3.2mm pin, with an M4 threaded hole or with a Ø14mm stub for JEOL SEM stage adapters with a 14mm connection.

Technical Support Bulletin: EM-Tec G0, G1, G2 &G4 geological thin section and slide holders with S-clips
Technical Support Bulletin: EM-Tec RG2 + RG4 geological thin sections top reference holders

Capacity, size and compatibility of the EM-Tec geological thin section on petrographic slide holders:

 

Gold series sample holders

The EM-Tec gold series SEM sample holders comprises a selection of compact SEM sample holders, all made from brass and plated with 1µm of pure gold.  Brass is chosen for greater strength and is fully non-magnetic. The gold plating assists in keeping the sample holders clean during handling. The superior chemical resistance of the gold plating facilitates the use of cleaning solutions or plasma cleaning. Clean sample holders surfaces will also greatly reduce contamination transfer to the samples. The EM-Tec gold series SEM sample holders are intended for use with table top SEMs, laboratory grade SEMs and FESEMs. The EM-Tec gold series sample holders and pin stub adapters currently available are:

  • EM-Tec GR2 – Tube/needle holder for up to Ø2mm diameter. Needle is clamped with a small stainless steel screw on the side. Ideal holder for Atomprobe sample needles. Made from brass and plated with 1µm of pure gold.
  • EM-Tec GS10 – A swivel vise which covers a full 180 angle and can also be rotated with the stub. This is the ultimate holder for imaging cross sections at any desired angle. The swivel head size without clamping screws is only 16x16x14mm. The sample is clamped with the two clamping screws; the swivel head can be locked in place with the tilt clamping screw. Made from brass and plated with 1µm of pure gold.
  • EM-Tec GB16 – Rectangular type bulk sample holder with two side brackets for sample thickness up to 16mm.  Sample are clamped with stainless steel set screws. Made from brass and plated with 1µm of pure gold. Ideal for smaller samples and smaller SEMs.
  • EM-Tec GR20 – Round type bulk sample holder with three brackets for round and awkwardly shaped samples up to Ø20mm. Samples are held with stainless steel screws. Made from brass and plated with 1µm of pure gold. Ideal for smaller samples and smaller SEMs.
  • EM-Tec GS25 – Lightweight, spider like holder for awkwardly shaped samples up to Ø25mm. Samples are supported by the three threaded legs and clamped by the flanges on the clamping nuts. Made from brass and plated with 1µm of pure gold.
  • EM-Tec GS45 – Lightweight, spider like holder for awkwardly shaped samples up to Ø45mm. Samples are supported by the three threaded legs and clamped by the flanges on the clamping nuts. Made from brass and plated with 1µm of pure gold.
  • EM-Tec GZM4 –  Compact Zeiss pin stub adapter with M4 threaded head to convert stubs and samples holders with an M4 threaded hole to a Zeiss pin stub. Pin is 3.2mm diameter and 6mm long. Made from brass and plated with 1µm of pure gold.
  • EM-Tec GSPM4 – Compact standard pin stub adapter with M4 threaded head to convert stubs and samples holders with an M4 threaded hole to a standard pin stub. Pin is 3.2mm diameter and 9.5mm long. Made from brass and plated with 1µm of pure gold.

Capacity and dimensions for the  EM-Tec gold series SEM sample holders and pin stub adapters:

 

Gripping stub & stub vises

The EM-Tec gripping stub and stub based vise holders are useful to grip and hold SEM samples without much need for sample preparation. Ideal for cross-section and edge-on imaging. The comprehensive selection of this type of cost-effective gripping and vise type holders is compatible with  SEMs using pin stubs (FEI, Zeiss, Tescan, Phenom, Aspex), SEMs using M4 thread (Hitachi and EM-Tec SEM stage adapters) and JEOL SEMs.

EM-Tec pin stub compatible gripping stub and stub based vise holders:

EM-Tec gripping stub and stub based vise holders with M4 thread:

EM-Tec JEOL stub based vise holders:

 

Low Profile S-Clip holders

The EM-Tec Low Profile S-Clip SEM sample holders have been developed to allow for very short working distance and high tilt of thin samples. The Low-Profile S-Clip holders can be used to clamp thin samples, such as Silicon chips, up to 1mm thickness. The EM-Tec Low Profile S-Clips are positioned in the narrow precision slots which are cut in the specimen mounts; the clips can be moved sideways for optimum positioning. The EM-Tec Low Profile S-Clips are less 0.3mm thick which enables bringing the sample within 1mm of the polepiece. The EM-Tec Low Profile S-Clips are made from non-magnetic phosphor bronze and can be easily modified to accommodate your samples. The currently available EM-Tec Low Profile S-Clip SEM sample holders are:

  • EM-Tec LPS12 with one short Low Profile S-Clip on a Ø12.7mm standard pin stub
  • EM-Tec LPS19 with two short Low Profile S-Clips on a Ø19 mm pin stub
  • EM-Tec LPS25 with two standard Low Profile S-Clips on a Ø25.4mm pin stub

The EM-Tec Low Profile S-Clip SEM sample holders are compatible with SEM, FESEM, SEM/FIB, Dualbeam and Crossbeam systems from Tescan, Thermo, FEI, Philips and Zeiss. For JEOL and Hitachi systems pin stub adapters should be used.

 

Metallographic mount holders

The EM-Tec metallographic mount holders are designed to hold metallographic, petrographic and ceramographic mounts or embeddings. These practical and sturdy holders are equally useful holding round samples with size similar to the mounts or for holding larger cylindrical specimen stubs. Available for all standard metallurgical mounts from 25 to 50mm diameter (1” to 2”). The samples are secured with an M3 set screw; an allen key is included with the holder. Additional longer screws are supplied to hold smaller samples as well. They are all made from vacuum grade aluminium and have undergone a final cleaning step which results in a satin surface finish. Available with:

  • standard pin to fit on SEM which use the standard pin; FEI, Philips, Tescan, Phenom, Pemtron, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, ETEC and Novascan SEMs.
  • M4 threaded hole compatible with Hitachi SEMs, FESEMs and table top SEMs and with the EM-Tec versatile SEM stage adapters
  • Ø14mm JEOL stub compatible with JEOL and EM-Tec stage adapters with a Ø14mm connection

Capacity and dimensions for the  EM-Tec metallographic mount holders:

 

Multiple mount holders

The EM-Tec multiple metallographic mount holders are designed to hold multiple metallographic, petrographic and ceramographic mounts or embeddings in a single holder. They are equally useful holding multiple round samples with a size similar to the mounts or for holding larger cylindrical specimen stubs. The EM-Tec multiple metallographic mount holders are available for standard metallurgical mounts with metric sizes of 25, 30, 40 and 50mm diameter and  SAE sizes of 1”, 1’1/4”, 1-1/2” and 2” diameter. The samples are secured with an M4 set screw; an allen key is included with the holder.
They are all made from vacuum grade aluminium and are available with

  • standard pin to fit on SEM which use the standard pin; Thermo, FEI, Philips, Tescan,  AmRay, Cambridge Instruments, Leica and CamScan SEMs.
  • M4 threaded hole compatible with Hitachi SEMs, FESEMs and table top SEMs and with the EM-Tec versatile SEM stage adapters
  • Ø 14mm JEOL stub compatible with JEOL and EM-Tec stage adapters with a Ø 14mm connection hole

To make these large holders compatible with smaller stages, each of the holders include both centre and additional excentric stage adapting capabilities.

 

Multiple Hitachi stub holders

The Em-Tec multiple stub holders are an economical and pragmatic way to load multiple Hitachi sample stubs with specimens in the SEM.  Using multiple stub holders saves time, allows multi sample processing or allows for quickly comparing samples against each other. The following types are offered:

  • EM-Tec H3 multiple stub holders for 3 x Ø15mm Hitachi cylinder stubs
  • EM-Tec H3Lmultiple stub holders for 3 x Ø25mm Hitachi cylinder stubs
  • EM-Tec H6 multiple stub holders for 6 x Ø15mm Hitachi cylinder stubs
  • EM-Tec H3/45 45° multiple stub holder for 3 x Ø15mm Hitachi cylinder stubs
  • EM-Tec H3/45R 45° multiple stub holder for 3 x Ø15mm Hitachi cylinder stubs with adjustable rotation
  • EM-Tec H6/45 45° multiple stub holder for 6 x Ø15mm Hitachi cylinder stubs
  • EM-Tec H6/45R 45° multiple stub holder for 6 x Ø15mm Hitachi cylinder stubs with adjustable rotation

The horizontal multi stub holders are based on the Ø25 x 6mm x M4 and the Ø50mm x 6mm x M4 Hitachi stubs to hold multiple stubs on M4 screws. The 45° multiple holders allow for a 45° pre-tilt which is beneficial for table top SEMs w/o a stage tilt or to quickly image under 45° w/o having to tilt the SEM stage. 45° tilted imaging tends to give a higher SE signal and reveals more of the topography of the specimen surface. The EM-Tec 45° multi stub holders are offered in two versions:

  • Fixed M4 threaded screws to hold the Hitachi stubs
  • Adjustable rotation M4 threaded screws allow for individual rotation of the Hitachi stubs to optimize viewing angle for the sample area

Capacity, size and compatibility of the EM-Tec multiple stub holders for Hitachi stubs:

 

Multiple JEOL stub holders

The EM-Tec multiple stub holders offer an efficient and cost-effective way to load multiple sample stubs with specimens in the SEM.  Using multiple stub holders saves time, allows multi sample processing or allows for quickly comparing samples against each other. Three types are offered:

  • EM-Tec J4 multiple stub holders for 4 of the Ø9.5mm JEOL SEM stubs
  • EM-Tec J3 multiple stub holders for 3 of the  Ø12.2mm JEOL SEM stubs
  • EM-Tec J7 multiple stub holder for 7 of the  Ø12.2mm JEOL SEM stubs

The EM-Tec J4 and J3 are based on a Ø32x10mm JEOL sample stub and accommodate either 4 of the  Ø9.5mm or 3 of the Ø12.2mm diameter JEOL cylinder stubs. The EM-Tec J7 is a larger disc of Ø50x15mm. Available formats are:

  •  JEOL Ø32x10mm cylinder stub compatible format for JEOL SEMs
  • Pin for SEMs using pin stubs
  • M4 threaded hole for Hitachi SEMs or the versatile EM-Tec SEM stage adapters

Capacity, size and compatibility of the EM-Tec multiple stub holders for JEOL SEM:

 

Multiple pin stub holders

The Em-Tec multiple pin stub holders are an efficient and cost-effective way to load multiple pin stubs with specimens in the SEM.  Saves time, allows multi sample processing or quickly comparing samples against each other. Intended for holding the standard 12.7mm (1/2”) pin stubs, although the larger 25.4mm (1”)pin stubs can be used on the holders for 6 pin stubs or more.  All the positions on the EM-Tec multiple pin stub holders for 6 pin stubs or more are numbered for easy identification and. Pin stubs are securely  held with small M3 stainless steel set screws for the multi pin stub holders up to 12 pin stubs; an allen key is included. On the 29 and 49 multi pin stub holders, the pin stubs are held with an integrated stainless steel spring.  The 6 and 8 multi pin holders comprise engraved crossed lines to assist with directional navigation. They are all made from vacuum grade aluminium and have undergone a final cleaning step which results in a satin surface finish. Available with:

  • standard pin to fit on SEMs which use the standard pin; FEI, Philips, Tescan, Phenom, Aspex, RJLee,      AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs
  • M4 threaded hole; compatible with Hitachi SEMs, FESEMs and table top SEMs and with the EM-Tec versatile SEM stage adapters
  • 32mm JEOL SEM stub format, compatible with 32mm stub holders on JEOL SEMs

Additionally there are two 45 degrees pre-tilt multi-pin holders available:

  • 3 x 45° pin stub holders
  • 6 x 45° pin stub holders

Capacity, size and compatibility of the EM-Tec multi pin stub holders:

 

Multi XL holder large

The innovative EM-Tec XL100 multi holder has been designed to hold 4 large SEM sample stubs or 4 SEM sample holders up to a diameter of 53mm. This holder is intended for use on large SEM sample stages with an X-Y travel range of 100x100mm or more. This practical and affordable holder greatly increases productivity for multiple sample imaging and analysing tasks. The EM-Tec XL100 multi holder can also be used on smaller stages in combination with the EM-Tec XT off-centre stage extender strips.
The unique X shape of the holder saves weigth, enables easy loading and securing stubs or holders on the EM-Tec XL100 multi holder. At the centre of the Em-Tec XL100,  the engraved X and numbers enable easy identification of each “leg”. Supplied with additional stub extenders to increase height and to bring the holders closer to the pole piece if flat samples need to be imaged or analysed.

Compatible SEM sample stubs for the EM-Tec XL100 multi holder are:

Compatible EM-Tec SEM sample holders are:

The EM-Tec XL100 increases productivity by holding multiple large samples which reduces venting and pumping times. Additionally, multiple samples can be analysed in a single session without operator interference (overnight operation).

Specifications of the EM-XL100 multi holder:

 

SampleClamp holders

The EM-Tec SampleClamp holders are specifically developed to hold thin wires, tubes, needles, probes and strips of material to enable easy imaging of the surfaces. The samples are clamped down by screws and two strips on a flat holder surface. The strips keep the samples flat. The maximum sample thickness is 3mm with the standard screws. Extra long screws are provided to increase the maximum sample thickness to 7mm. No carbon paint or conductive adhesive is needed. Also a useful holder for porous or sensitive materials where adhesives can easily penetrate the material which could cause artifacts. The EM-Tec SampleClamp sample holders are all precision machined from vacuum grade aluminium with non-magnetic brass screws to hold the strip or the samples. There are four types of the EM-Tec SampleClamp SEM holders:

  • EM-Tec SC1 SampleClamp with a clamping area of 15x10mm. For small and thin wire, strip, fibre, cables, tubes, etc. Available with pin stub or M4 threaded hole
  • EM-Tec SC2 SampleClamp with a clamping area of 25x15mm. For larger and thicker wires, strips, cables, tubes, rods, etc. Available with pin stub or M4 threaded hole
  • EM-Tec SC2R SampleClamp with a recessed area of 25x15mm. The recessed part leaves the sample area to be examined fully free standing. This allows for a complete rotation of the sample to examine all sides. The recessed area tends to be out of focus which leaves more emphasis on the sample. Tip: to avoid signal from the recessed area, one could place a carbon disc underneath the sample; this will greatly reduce both electron and X-ray signal.
  • EM-Tec mini SampleClamp includes a single screw with a washer to clamp specimen. The EM-Tec mini SampleClamps are based on SEM stubs and are available in pin stub, Hitachi m4 stub and JEOL cylinder stub format. The Em-Tec mini SampleClamps can also be used in conjunction with thin disposable aluminium sheet squares or discs.

When the  EM-Tec SEM stub adapters are used, the EM-Tec SampleClamp holders can be adapted to virtually any SEM.

Capacity, size and compatibility of the EM-Tec SampleClamp SEM holders:

 

S-Clip sample holders

The EM-Tec S-Clip sample holders all comprise one or more springloaded sample clips (S-Clips) either on an SEM sample stub or a SEM sample holder. The springloaded S-clips are specifically designed to hold thin specimens up to 2mm on a holder. Optional stand-off pillars are available to accomodate thicker samples. Small washers can also be used to increase the clamping height.

The S-clip are mounted with a small M2 screw which allows the S-clip to rotate. The S-Clips are made from conductive spring grade copper alloy; samples are clamped securely without the need for conductive adhesives or conductive pastes. Sample changing is quick, easy and clean; contamination issues due to adhesives or glues are eliminated. They are ideal to hold Si chips and other thin samples.

The EM-Tec S-Clip SEM sample holders are available  for the following SEM platforms:

  • Standard pin stubs for FEI, Philips, Tescan, Phenom, Aspec, Cambridge, CamScan, Leica etc
  • Zeiss pin stubs (shorter pin) for Zeiss & LEO SEMs
  • JEOL plain cylinder sample stubs
  • Hitachi M4 cylinder sample stubs

The EM-Tec S-Clip sample holders are available to hold samples horizontal (flat), at 45° or at 90°. The 45° and 90° are useful for holding cross sections of thin samples and wafer pieces. EM-Tec S-Clip sample holders are a cost effective alternative for the 1”-3” wafer holders. They can hold the smaller 1”(25.4mm), 2” (51mm) and 3”(76mm) wafers if it is allowed to hold the wafer down with the S-Clips:

  • EM-Tec S-Clip holders with 38m stub diameter is suitable for:      1” (25.4mm) wafers
  • EM-Tec S-Clip holders with 63m stub diameter is suitable for:     2” (51mm) wafers
  • EM-Tec S-Clip holders with 100mm stub diameter is suitable for: 3” (76mm) wafers

The EM-Tec S-Clips are also separately available to enable customers to make their own custom made sample clip holders.  Dimensions are 12.8mm long, tip is 1.6mm wide, height is 1.5mm with a Ø2.2mm hole for mounting with an M2 screw. Made from 0.25mm thin spring grade copper alloy. Include with the EM-Tec S-clips are the M2x3 mounting screws.

The EM-Tec S-Clips are also separately available to enable customers to make their own custom made sample clip holders.  Dimensions are 12.8mm long, tip is 1.6mm wide, height is 1.5mm with a Ø2.2mm hole for mounting with an M2 screw. Made from 0.25mm thin spring grade copper alloy. Include with the EM-Tec S-clips are the M2x3 mounting screws.

 

Small sample holders

The EM-Tec stub based SEM sample holders are all small SEM sample holders based on (modified) SEM sample stubs. They have the same footprint as the original SEM sample stubs and are directly compatible with the SEM stage or SEM sample stub holder.  These affordable sample holders increase efficiency and reduce sample preparation time. Using sample holders reduces the use of conductive adhesives which can be a source of contamination. The EM-Tec stub based small sample holders formats are:

The pin stub based sample holders comprise the largest selection; they can be easily used on other SEM platforms by using the cost efficient EM-Tec SEM stub adapters. All EM-Tec compact SEM stub based SEM sample holders are precision machined from vacuum grade aluminium unless otherwise noted. Provided with set screws and allen keys.

EM-Tec pin stub based compact sample holders:

There is a wide choice of the compact EM-Tec pin stub based sample holders. Since they are small and using the standard pin stub format, they will fit in virtually any SEM compatible with standard pin stubs. They are based on standard pin stubs or made from modified pin stubs with a pin size of Ø3.15mm and a pin length of 9.5mm. Ideal for table top SEMs such as the Phenom but just as useful on laboratory grade SEMs and FESEMs. Using a sample holders is quicker, cleaner and provides more stability than conductive tapes or glues.
The EM-Tec based compact pin stub holders line up include:

 

Small vise holders

The EM-Tec gripping stub and stub based vise holders are useful to grip and hold SEM samples without much need for sample preparation. Ideal for cross-section and edge-on imaging. The comprehensive selection of this type of cost-effective gripping and vise type holders is compatible with  SEMs using pin stubs (FEI, Zeiss, Tescan, Phenom, Aspex), SEMs using M4 thread (Hitachi and EM-Tec SEM stage adapters) and JEOL SEMs.

EM-Tec pin stub compatible gripping stub and stub based vise holders:

EM-Tec gripping stub and stub based vise holders with M4 thread:

EM-Tec JEOL stub based vise holders:

 

Spring-loaded vise holders

The EM-Tec spring-loaded vise type SEM sample holders are quick and easy to use. They hold the sample by clamping it between the moving jaws, this enables quick sample loading and reduces down time.  They are especially useful when similar samples or series of the same sample need to be examined. Using a spring-loaded SEM sample holder is easier, quicker and cleaner than using conductive adhesives or glue. A vise clamps the sample and provides the rigidity needed for high resolution imaging. The spring-loaded EM-Tec SEM sample holders currently available are:

  • EM-Tec VS8 mini spring-loaded vise for samples up to 8mm
  • EM-Tec VS12 compact single action spring-loaded vise for samples up to 12mm
  • EM-Tec VS12-T compact spring-loaded vise for up to 12mm with 0-90 degrees tilt capabilities
  • EM-Tec VS26 medium double action spring-loaded vise for samples up to 26mm
  • EM-Tec VS42 large universal double action spring-loaded vise for samples up to 42mm

The EM-Tec vise sample holders are available with pin and with an M4 threaded hole. For use on JEOL SEMs, we suggest to use an EM-Tec SEM stub adapter or an EM-Tec stage adapter.

Technical Support Bulletin: EM-Tec VS8 mini spring-loaded SEM sample vise
Technical Support Bulletin: EM-Tec VS12 compact single action spring-loaded vise
Technical Support Bulletin: EM-Tec VS26 compact dual action spring-loaded SEM sample vise
Technical Support Bulletin: EM-Tec VS42 universal spring-loaded vise

Specifications of the EM-Tec spring-loaded vise clamp holders:

 

Soft jaw lining kit

The EM-Tec conductive soft jaw lining kit for vise type SEM sample holders comprises a conductive neoprene rubber sheet with a conductive adhesive layer on one side. It is intended to hold more delicate samples and to prevent marring or damaging sensitive surfaces. The conductive medium soft rubber provides both a soft grip and a grounding path.

The EM-Tec conductive soft jaw lining kit is compatible with the following SEM sample holders:

Technical Support Bulletin: Clamping delicate sample in vise type SEM holders

Specifications of the conductive neoprene rubber sheet with conductive adhesive:

 

STEM imaging holder

TEM samples are  very thin and therefore don’t exhibit signal originating from bulk. This enables improved surface imaging and increased spatial resolution. These are clear advantages for SEM/EDX studies of thin films, fine dispersions, inclusions, precipitations and low-Z materials. An SEM or rather FESEM can also be used to check TEM samples or lamellas made with a FIB before inserting in a TEM.
There are two methods of imaging TEM samples and they require differetn type of TEM grid holders:

  • surface imaging and investigation require TEM grid holders
  • STEM imaging which requires a special TEM grid holder with integrated conversion plate

The EM-Tec TEM grids holders enables investigating TEM samples in the SEM. They are intended for use in table top SEMs, laboratory grade SEMs, FESEMs, Auger, SIMS and light microscopes. The EM-Tec grid holder can also be used to quickly check the sample (after FIB procedures) before investigating it with a TEM. The EM-Tec grid holders are intended for use in an SEM, Auger, SIMS and light microrcopes. They are all precision machined from vacuum grade aluminium.

Capacity, size and compatibility of the EM-Tec ST1 STEM imaging holder:

 

Swivel tilt sample holders

The range of EM-Tec swivel sample holders

  • EM-Tec PS17 mini swivel vise mount to hold sample or cross sections up to 4mm thick.  The sample is held by a set screw.  Dimensions above pin are Ø12x18mm. Also available as EM-Tec HS17 for Hitachi SEM and JS17 for JEOL SEMS.
  • EM-Tec PS18 mini split mount swivel vise to hold samples from 0-8mm between mini vise jaws. Closed, the dimensions are Ø15x24mm above pin; when opened dimensions are 23x15x24mm above pin. Also available as HS18 for Hitachi SEM and JS18 for JEOL SEMs.
  • EM-Tec GS10 swivel vise for larger samples and cross sections from 0-10mm; even allows mounting two cross sections at the time. This is the ultimate holder for imaging cross sections at any desired angle.  The swivel head size without clamping screws is only 16x16x14mm. The sample is clamped with the two clamping screws; the swivel head can be locked in place with the tilt clamping screw. Made from gold plated brass. Also available as HG10 for Hitachi SEM and JG10 for JEOL SEMs.
  • EM-Tec PS19 wide swivel clamp to hold samples up to 16mm. The sample is held by a set screw. Dimensions are  Ø25x24mm above pin.  Also available as PS19 for Hitachi SEM and JS19 for JEOL SEMs.
  • EM-Tec PS15 swivel pin stub mount. Excellent mount for SEMs without tilting facilities or when random tilt angled are needed. Top diameter is 15mm and height above pin is 15mm.  Also available as HS15 for Hitachi SEM and JS15 for JEOL SEMs.
  • EM-Tec PS15C S-Clip swivel pin stub mount with an S-Clip to clamp thin samples up to 2mm thickness. Allows full 90 degrees tilt each way.  Dimensions are Ø15x17mm above pin. Also available as HS15C for Hitachi SEM and JS15C for JEOL SEMs.
  • EM-Tec PSM4 swivel mount adapter with M4. This swivel adapter converts small sample holders into swivel holders or mounting Hitachi stubs to convert into swivel stubs. The EM-Tec PSM4 swivel mount adapter is intended for smaller holders and stubs since larger holders do limit the tilt range. Dimensions are Ø9×14 above pin. Also available as HSM4 for Hitachi SEMs and as LSM4 for JEOL SEMS.

Capacity, size and compatibility of the EM-Tec swivel holders, mounts and adapters:

 

t-EBSD sample holders

The EM-Tec  t-EBSD holders are specifically designed to generate transmission Kikuchi patterns. The transmission EBSD holders include an opening of Ø2mm in the base. The top is formed by a fork-shaped phosphor bronze clip which clamps the TEM or FIB grid.  Transmission EBSD imaging and analysis is possible over the Ø2mm  area.
The  EM-Tec t-EBSD holders are available  with 1 of 3 TEM grid capacity. The choice of configuations include:

  • EM-Tec T1 t-EBSD sample holder for a single TEM or FIB grid, standard Ø3.2mm (1/8”) pin to be mounted on existing pre-tilt holders
  • EM-Tec T3 t-EBSD sample holder for three TEM or FIB grids, standard Ø3.2mm (1/8”) pin to be mounted on existing pre-tilt holders
  • EM-Tec TE1 t-EBSD sample holder kit for a single TEM or FIB grid with 70° and 20° pre-tilt, pin / M4
  • EM-Tec TE3 t-EBSD sample holder kit for three TEM or FIB grid with 70° and 20° pre-tilt, pin / M4

Capacity, size and compatibility of the EM-Tec t-EBSD sample holder and kits:

 

TEM grid holders

The EM-Tec TEM grids holders enables investigating TEM samples in the SEM. They are intended for use in table top SEMs, laboratory grade SEMs, FESEMs, Auger, SIMS and light microscopes. The EM-Tec grid holder can also be used to quickly check the sample (after FIB procedures) before investigating it with a TEM. The EM-Tec grid holders are intended for use in an SEM, Auger, SIMS and light microrcopes. They are all precision machined from vacuum grade aluminium. There are three EM-Tec TEM grid holders:

  • EM-Tec TG4 pin stub based TEM grid holder for up to four TEM grids. Numbered positions with machined pockets and side grooves for loading/unloading the TEM  grids. The TEM grids are clamped down by the top plate and a central brass screw. Through hole size is Ø2.1mm with a 60° side angle on top and base to reduce electron and X-ray scattering interference from the holder. Overall size is Ø18×3.2mm with a 15mm long standard 3.2mm pin. The longer pin creates a distance from the stage adapter to reduce electron and X-ray signals from the SEM stage.
  • EM-Tec PS11 mini pin stub holder for a single TEM or FIB grid. TEM grid rim rests on a ledge; in the middle of the cavity there is dimple to provide a non-touching area for the mesh of the grid. Groove is provided for easy loading/unloading of the TEM grid with fine tweezers. The TEM grid is not clamped. This holder is used for quickly checking a TEM grid in the SEM or as a TEM grid holder for a carbon evaporator.
  • EM-Tec PS14 mini pin stub holder for four TEM or FIB grids. TEM grid rim rests on a ledge; in the middle of each cavity there is dimple to provide a non-touching area for the mesh of the grid. Grooves are provided for easy loading/unloading of the TEM grids with fine tweezers. The TEM grids are not clamped. This holder is used for quickly checking  up to four TEM grids in the SEM or as a grid holder for a carbon evaporator.

Capacity, size and compatibility of the EM-Tec ST1 STEM imaging holder:

 

Top Reference Holders

The EM-Tec top reference holders ensure the same focus conditions for the SEM and same take-off angle for the X-ray analysis system the for all mounts in the holder. They have been designed for SEM/EDS/WDS analysis on multiple metallographic and petrographic mounts. The mounts are placed against three reference lips and secured with screws from the side. The reference lips are only 1mm thick and beveled to reduce X-ray analysis interference. It is intended for the larger analytical SEMs with a large SEM stage. Made from vacuum grade aluminium with stainless steel screws. One of the positions can be used to hold a calibration standard with pure elements and/or known compounds.

Specifications of the EM-Tec top reference holders:

 

Universal sample holder kit

The EM-Tec U2 universal SEM sample holder and SEM stub adapter kit has been created to hold a wide variety of SEM samples up to 42mm. The samples can be flat, round, block or akwardly shaped. Also included in this kit is a useful selection of SEM stub adapters which enables using this kit on virtually any SEM. Fully compatible with FEI/Philips, JEOL, Hitachi, Tescan, Zeiss/LEO and other brands of SEMs.

Ideally suited for:

  • multi-user environments
  • labs with different brands of SEMs
  • labs with a large and changing variety of samples
  • service labs to cope with different sample stubs
  • portability between SEM platforms

Features of the EM-Tec U2 universal SEM sample holder and adapter kit:

  • versatile and universal kit for samples up to 42mm sample size
  • quick and easy sample holding
  • SEM platform independent
  • SEM platform interchangeable
  • conversion set for SEM sample stubs included
  • effortless reconfiguration of SEM sample holders
  • practical, productive, portable
  • neatly arranged in a wooden box

XT stage extender strips

Versatile vise clamp holders

Versa-Plate adaptable holder

Wafer holders

°360°/90°off-set holder

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