SNE-3000MS
Affordable entry-level benchtop SEM
Standard desktop SEM with SE-detector and 3-axis (X,Y,R) stage system. With 20x-60,000x magnification and 15 nm resolution, it is suitable for surface inspection at medium magnification.
The SNE-3000MS is an entry-level scanning electron microscope that is one of the most affordable models on the market. With its basic configuration and easy-to-use software it can be used for routine inspections as well as educational purposes.
Key features
- 15 nm resolution
- 60,000x magnification
- Single SE detector
- 1-30 kV beam energy (5 steps)
- 3-axis (X,Y,R) sample stage
- Sample size max Ø70mm x 30mm height
Options
- EDS (Bruker)
- EDS (EDAX)
- Cool stage system (Peltier)
For an entry-level system with low-vacuum capabilities, see SNE-3200M.
Recommended applications
- Surface inspection
- Routine and quality control
- Education
- Low-to-medium magnification imaging
Specifications
Electron System
Resolution:
15nm (30kV, SE Image)
Magnification:
20x~60,000x
Accelerating Voltage:
1~30kV (1/5/10/15/20/30)
Detector:
SE (Secondary electron)
Electron Gun:
Pre-centered Tungsten Filament Cartridge
Stage System
Stage Traverse:
3-axis manual system: X, Y: 40 mm, R : 360˚
Max. Sample Size:
70 mm in Diameter x 30 mm in Height
Image System
Automation Function:
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness
Image Format:
BMP, JPEG, PNG, TIFF
Vacuum System
Vacuum Mode:
High Vacuum
Vacuum Pump:
Rotary Pump / Turbo Molecular Pump (Full Automation)
Dimensions
Main Unit:
390(W)x380(D)x560(H)mm, 83kg
Controller Unit:
390(W)x325(D)x560(H)mm, 37kg
Rotary Pump:
400(W)x160(D)x340(H)mm, 24kg
