SNE-4500M

Affordable high-resolution benchtop SEM
High-resolution (5nm) desktop SEM with SE-detector and 5-axis (X,Y,R,Z,T) stage system for specimen inspection up to 100,000x.

 

The SNE-4500 is a high-resolution benchtop microscope that is one of the most affordable models on the market. Sample positioning is easy with the 5-axis stage control and the variable apertures gives more control over imaging.

Key features

  • 5 nm resolution
  • 100,000x magnification
  • Single SE detector
  • 1-30 kV beam energy (5 steps)
  • 5-axis (X,Y,R,Z,T) sample stage
  • Variable apertures
  • Sample size max Ø80mm x 35mm height

Options

  • EDS (Bruker)
  • EDS (EDAX)
  • Cool stage system (Peltier)

For high-resolution system with low-vacuum capabilities, see SNE-4500M Plus B.

Recommended applications

  • RnD
  • Routine and quality control
  • Education

Specifications

Electron System
Resolution:
5nm (30kV, SE Image)
Magnification:
20x~100,000x
Accelerating Voltage:
1~30kV (1/5/10/15/20/30)
Detector:
SE (Secondary Electron)
Electron Gun:
Pre-centered Tungsten Filament Cartridge

Stage System
Stage Traverse:
5-axis manual system: X, Y: 40mm, R : 360˚, Z : 0 to 35mm, T : 0-45˚
Max. Sample Size:
80mm in Diameter x 35mm in Height

Image System
Automation Function: 
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness
Image Format: 
BMP, JPEG, PNG, TIFF

Vacuum System
Vacuum Mode:
High Vacuum
Vacuum Pump: 
Rotary Pump / Turbo Molecular Pump (Full Automation)

Dimensions
Main Unit: 
390(W)x380(D)x560(H)mm, 88kg
Controller Unit:
390(W)x325(D)x560(H)mm, 37kg
Rotary Pump: 
400(W)x160(D)x340(H)mm, 24kg

Specifikationer

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