SNE-4500MAffordable high-resolution benchtop SEM
High-resolution (5nm) desktop SEM with SE-detector and 5-axis (X,Y,R,Z,T) stage system for specimen inspection up to 100,000x.
The SNE-4500 is a high-resolution benchtop microscope that is one of the most affordable models on the market. Sample positioning is easy with the 5-axis stage control and the variable apertures gives more control over imaging.
- 5 nm resolution
- 100,000x magnification
- Single SE detector
- 1-30 kV beam energy (5 steps)
- 5-axis (X,Y,R,Z,T) sample stage
- Variable apertures
- Sample size max Ø80mm x 35mm height
- EDS (Bruker)
- EDS (EDAX)
- Cool stage system (Peltier)
For high-resolution system with low-vacuum capabilities, see SNE-4500M Plus B.
- Routine and quality control
5nm (30kV, SE Image)
SE (Secondary Electron)
Pre-centered Tungsten Filament Cartridge
5-axis manual system: X, Y: 40mm, R : 360˚, Z : 0 to 35mm, T : 0-45˚
Max. Sample Size:
80mm in Diameter x 35mm in Height
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness
BMP, JPEG, PNG, TIFF
Rotary Pump / Turbo Molecular Pump (Full Automation)