SNE-3200M

Versatile desktop SEM with dual SE and BSE detectors and 3-axis (X,Y,R) stage system. With 20x-60,000x magnification and 15 nm resolution, it is suitable for surface inspection at medium magnification.

 

The SNE-3200M is an entry-level microscope with dual detectors and low-vacuum capabilities.

Key features

• 15 nm resolution
• 60,000x magnification
• Dual SE and BSE detectors
• Dual view mode
• 1-30 kV beam energy (6 steps)
• 3-axis (X,Y,R) sample stage
• Sample size max Ø70mm x 30mm height

Options

• EDS (Bruker)
• EDS (EDAX)
• Cool stage system (Peltier)

Recommended applications

• Surface inspection
• Routine and quality control
• Education
• Low-to-medium magnification imaging

Specifications

Electron System
Resolution:
15nm (30kV, SE Image), 20nm (30kV, BSE Image)
Magnification:
20x~60,000x
Accelerating Voltage:
1~30kV (1/5/10/15/20/30)
Detector:
SE (Secondary electron), BSE (Backscattered electron) dual detector
Electron Gun:
Pre-centered Tungsten Filament Cartridge

Stage System
Stage Traverse:
3-axis manual system: X, Y: 35 mm, R : 360˚
Max. Sample Size:
70 mm in Diameter x 30 mm in Height

Image System
Automation Function: 
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness
Image Format: 
BMP, JPEG, PNG, TIFF

Vacuum System
Vacuum Mode:
High Vacuum and Low Vacuum
Vacuum Pump: 
Rotary Pump / Turbo Molecular Pump (Full Automation)

Dimensions
Main Unit: 
390(W)x380(D)x560(H)mm, 83kg
Controller Unit:
390(W)x325(D)x560(H)mm, 37kg
Rotary Pump: 
400(W)x160(D)x340(H)mm, 24kg