Broad-beam ion mill system for final polishing and cleaning
The Gentle Mill series of Technoorg has been designed for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or FIB columns. The patented low-energy ion source and the special sample holder help to reach the ultimate quality for any demand.
Key features
Automated operation
Final step for perfect result
protective transfer capsule
Special adaptor for Hitachi microscopes
Online monitoring and support
Ion beam workstation for preparing highest quality TEM/FIB samples
Fast, reliable method for cleaning and post-processing of TEM and FIB samples
User-independent, automated operation with pre-programmed recipes
Application in industrial environment
Special model for direct application of 3D sample holder of Hitachi’s FIB-STEM/TEM systems
