SNE-3000MS

Affordable entry-level benchtop SEM
Standard desktop SEM with SE-detector and 3-axis (X,Y,R) stage system. With 20x-60,000x magnification and 15 nm resolution, it is suitable for surface inspection at medium magnification.

 

The SNE-3000MS is an entry-level scanning electron microscope that is one of the most affordable models on the market. With its basic configuration and easy-to-use software it can be used for routine inspections as well as educational purposes.

Key features

  • 15 nm resolution
  • 60,000x magnification
  • Single SE detector
  • 1-30 kV beam energy (5 steps)
  • 3-axis (X,Y,R) sample stage
  • Sample size max Ø70mm x 30mm height

Options

  • EDS (Bruker)
  • EDS (EDAX)
  • Cool stage system (Peltier)

For an entry-level system with low-vacuum capabilities, see SNE-3200M.

Recommended applications

  • Surface inspection
  • Routine and quality control
  • Education
  • Low-to-medium magnification imaging

Specifications

Electron System
Resolution:
15nm (30kV, SE Image)
Magnification:
20x~60,000x
Accelerating Voltage:
1~30kV (1/5/10/15/20/30)
Detector:
SE (Secondary electron)
Electron Gun:
Pre-centered Tungsten Filament Cartridge

Stage System
Stage Traverse:
3-axis manual system: X, Y: 40 mm, R : 360˚
Max. Sample Size:
70 mm in Diameter x 30 mm in Height

Image System
Automation Function: 
Auto Start, Auto Focus, Auto Stigmator, Auto Contrast & Brightness
Image Format: 
BMP, JPEG, PNG, TIFF

Vacuum System
Vacuum Mode:
High Vacuum
Vacuum Pump: 
Rotary Pump / Turbo Molecular Pump (Full Automation)

Dimensions
Main Unit: 
390(W)x380(D)x560(H)mm, 83kg
Controller Unit:
390(W)x325(D)x560(H)mm, 37kg
Rotary Pump: 
400(W)x160(D)x340(H)mm, 24kg

Supplier

SOFIA PETTERSSON Product specialist Microscopy 010-155 03 17