HIPP-3
Analyser for high-pressure applications
The HiPP-3 analyser features a newly developed patent pending technology for outstanding imaging XPS at ambient conditions with a spatial resolution of better than 10 μm. In addition, the newly developed Swift Acceleration Mode enables unparalleled transmission, with countrates improved by up to a factor of 10.
The newly developed HiPP-3 analyser has been optimized for XPS energies (up to 1500 eV). In this range, the transmission has been dramatically increased with the development of a new lens mode.
Key features
- Imaging XPS < 10 μm resolution
- Swift Acceleration Mode for unprecedented transmission
- Refocusing pre-lens with efficient differential pumping
- Angular resolved range: 18°
- Interchangeable / customized front cones
Specifications
Supplier
