Analyser for high-pressure applications
The HiPP-3 analyser features a newly developed patent pending technology for outstanding imaging XPS at ambient conditions with a spatial resolution of better than 10 μm. In addition, the newly developed Swift Acceleration Mode enables unparalleled transmission, with countrates improved by up to a factor of 10.

The newly developed HiPP-3 analyser has been optimized for XPS energies (up to 1500 eV). In this range, the transmission has been dramatically increased with the development of a new lens mode.

Key features

  • Imaging XPS < 10 μm resolution
  • Swift Acceleration Mode for unprecedented transmission
  • Refocusing pre-lens with efficient differential pumping
  • Angular resolved range: 18°
  • Interchangeable / customized front cones