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Microscopy
Electron microscopy sample preparation
Consumables
Consumables
Supplies needed to mount and coat samples for SEM and TEM based analysis, among others.
Sputter targets
High-purity sputter targets for a wide variety of applications and sputter coaters
Supports and substrates
Vitreous carbon, graphite, mica and silicon wafers and discs
Carbon sources
Spectroscopically pure carbon fibers and ultra-high purity carbon rods
Conductive and non-conductive tapes and tabs
Carbon, copper, aluminium, polyimide and mylar tapes and double-sided carbon tabs.
TEM grids and support films
With several materials, grid patterns and mesh sizes available
SEM sample stubs
A wide variety of functions and sizes for all the major microscopes
SOFIA PETTERSSON
Product specialist Microscopy
010-155 03 17