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Microscopy
Electron microscopy sample preparation
Broad-beam ion mills
Broad-beam ion mills
Fully automated broad ion beam systems for rapid thinning and final polishing and cleaning.
SEMPrep2
High-quality sample preparation for SEM
UniMill
Fully automated ion beam thinning system
GentleMill
Broad-beam ion mill system for final polishing and cleaning
SOFIA PETTERSSON
Product specialist Microscopy
010-155 03 17
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