Jonetsning och jonpolering

Ion mills for TEM applications

Technoorg Linda IV7 UniMill 

UniMill The IV7 UniMill can prepare high quality TEM samples with unsurpassed high thinning rate. In addition, the unique low-energy ion gun enables gentle surface polishing and cleaning of TEM and FIB samples, giving this instrument the capability of producing damage- and artifact-free samples by low-energy ion bombardment.   Read more »

Technoorg Linda IV8 GentleMill 

GentleMill The IV8 GentleMill has been designed for cleaning and post processing of TEM and FIB samples, with optional SEM holders for slope cutting and polishing for EBSD and OIM. The low energy of the ion beam guarantees minimization of surface damage and ion beam induced amorphization.  
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Ion mills for SEM applications

Technoorg Linda SEMPrep2 (SC-2000)

The SEMPrep2 ion mill from Technoorg Linda enables rapid slope-cutting as well as gentle surface cleaning of SEM samples in one space-saving design. The system also provides an ion milling based solution for improving and cleaning of mechanically polished SEM samples and preparation of damage-free surfaces for EBSD technique.   Read more »

Ion mills for polishing and gentle cleaning

Technoorg Linda IV8 GentleMill 

GentleMill The IV8 GentleMill has been designed for cleaning and post processing of TEM and FIB samples, with optional SEM holders for slope cutting and polishing for EBSD and OIM. The low energy of the ion beam guarantees minimization of surface damage and ion beam induced amorphization.  
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Mechanical preparation

Technoorg Linda Micropol

Micropol Polishing instrument for TEM and metallography.  
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Technoorg Linda Microsaw

Microsaw Precise tool for cutting under stereomicroscope.    
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Technoorg Linda Microheat

Microheat For thermoplastic gluing under stereomicroscope.  
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